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LeafPoseNet: A low-cost, high-accuracy method for estimating flag leaf angle in wheat
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DOI：10.1016/j.cj.2025.07.002.png)
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Abstract
En 中文
Flag leaf angle (FLANG) is one of the key traits in wheat breeding due to its impact on plant architecture, light interception, and yield potential. An image-based method of measuring FLANG in wheat would reduce the labor and error of manual measurement of this trait. We describe a method for acquiring in-field FLANG images and a lightweight deep learning model named LeafPoseNet that incorporates a spatial attention mechanism for FLANG estimation. In a test dataset with wheat varieties exhibiting diverse FLANG, LeafPoseNet achieved high accuracy in predicting the FLANG, with a mean absolute error (MAE) of 1.75°, a root mean square error (RMSE) of 2.17°, and a coefficient of determination (R2) of 0.998, significantly outperforming established models such as YOLO12x-pose, YOLO11x-pose, HigherHRNet, Lightweight-OpenPose, and LitePose. We performed phenotyping and genome-wide association study to identify the genomic regions associated with FLANG in a panel of 221 diverse bread wheat genotypes, and identified 10 quantitative trait loci. Among them, qFLANG2B.2 was found to harbor a potential causal gene, TraesCS2B01G313700, which may regulate FLANG formation by modulating brassinosteroid levels. This method provides a low-cost, high-accuracy solution for in-field phenotyping of wheat FLANG, facilitating both wheat FLANG genetic studies and ideal plant type breeding.
Keywords:
Wheat
Flag leaf angle
Lightweight network
LeafPoseNet
Genome-wide association study
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