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Making graphene visible

delete2007-08-10
delete1.9K
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OA
AI
B
Blake, P. *
H
Hill, E. W.
C
Castro Neto, A. H.
N
Novoselov, K. S.
J
Jiang, D.
Y
Yang, R.
B
Booth, T. J.
G
Geim, A. K.
DOI:10.1063/1.2768624delete
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Abstract

Abstract

En 中文
Microfabrication of graphene devices used in many experimental studies currently relies on the fact that graphene crystallites can be visualized using optical microscopy if prepared on top of Si wafers with a certain thickness of SiO2. The authors study graphene's visibility and show that it depends strongly on both thickness of SiO2 and light wavelength. They have found that by using monochromatic illumination, graphene can be isolated for any SiO2 thickness, albeit 300 nm (the current standard) and, especially, approximate to 100 nm are most suitable for its visual detection. By using a Fresnel-law-based model, they quantitatively describe the experimental data. (c) 2007 American Institute of Physics.
Keywords:
FILMS

Journal

Applied Physics Letters cover
Applied Physics Letters
IF:
3.6
Papers:
10.4W
Citations:
17.8W

Organization

No organization information available
Cited Papers

Cited Papers

Raman Spectrum of Graphene and Graphene Layers
err2006-10-30
err0
errOAAI
errA. C. Ferrari; J. C. Meyer; V. Scardaci; C. Casiraghi; M. Lazzeri; F. Mauri; S. Piscanec; D. Jiang; K. S. Novoselov; S. Roth; A. K. Geim
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Electronic color charts for dielectric films on silicon
err2004-04-05
err112
errOAAI
errHenrie, J; Kellis, S; Schultz, SM; Hawkins, A
errShare
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Electric Field Effect in Atomically Thin Carbon Films
err2004-10-22
err0
errOAAI
errK. S. Novoselov; A. K. Geim; S. V. Morozov; D. Jiang; Y. Zhang; S. V. Dubonos; I. V. Grigorieva; A. A. Firsov
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Two-dimensional atomic crystals
err2005-07-18
err1.1W
errOAAI
errNovoselov, KS; Jiang, D; Schedin, F; Booth, TJ; Khotkevich, VV; Morozov, SV; Geim, AK
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The rise of graphene
err2007-03-01
err3.8W
PREAI
errGeim, A. K.; Novoselov, K. S.
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