Measuring Temperature-Induced Strain Changes using Transmission Kikuchi Diffraction

doi:10.1093/mam/ozag053.205

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Measuring Temperature-Induced Strain Changes using Transmission Kikuchi Diffraction

2026-07-27

Matthew Mecklenburg *

DOI：10.1093/mam/ozag053.205

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Abstract

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Microscopy and Microanalysis

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2.5K

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6.2K

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university of california

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2.6K

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Nanoscale temperature mapping in operating microelectronic devices

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