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Microstructure inference of organic thin films via light modulated photocurrent characterization
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DOI：10.1016/j.orgel.2026.107442.png)
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Abstract
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• Modulation-resolved microstructure inference: Demonstrates that amplitude-modulated electrical measurements encode quantitative morphological information. • Microstructure-aware excitonic drift–diffusion modeling: Simulates transient J(t) responses for 500 structurally diverse donor–acceptor morphologies. • Physics-guided transient feature engineering: Extracts compact time- and frequency-domain descriptors capturing morphology-dependent dynamics. • Interpretable and data-efficient surrogate models: Achieves strong predictive performance (R 2> 0.9 for key descriptors) using <10% training data. • Automation-compatible characterization pathway: Establishes a scalable route toward compact, non-destructive microstructure diagnostics for high-throughput organic electronics research.
Keywords:
microstructure inference
photocurrent characterization
organic thin films
excitonic drift–diffusion modeling
data-efficient surrogate models
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2.6
Papers:
244
Citations:
1.1W
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