arrow
Return

Multi-focus TIE algorithm including partial spatial coherence and overlapping filters

delete2018-04-24
delete6
delete
OA
AI
A
Alberto Eljarrat *
J
Johannes Müller
M
Michael R. S. Huang
C
Christoph T. Koch
DOI:10.1364/OE.26.011819delete
deleteOriginal
deleteShare
deleteSave
View PDF
Abstract

Abstract

En 中文
The transport of intensity equation (TIE) relates the variation of intensity of a wave-front along its mean direction of propagation with its phase. In experimental application, characteristic artefacts may affect the retrieved phase. These originate from inadequacies in estimating the axial derivative and the amplification of noise in the inversion of the TIE. To tackle these issues, images recorded at multiple planes of focus can be integrated into a multi-focus TIE (MFTIE) solution. This methodology relies on the efficient sampling of phase information in the spatial-frequency domain, typically by the definition of band pass filters implemented as a progression of sharp spatial frequency cut-offs. We present a convenient MFTIE implementation which avoids the need for recording images at very specific planes of focus and applies overlapping cut-offs, greatly simplifying the experimental application. This new approach additionally also accounts for partial spatial coherence in a flux-preserving framework. Using simulated data as well as experimental data from optical microscopy and electron microscopy we show that the frequency response of this MFTIE algorithm recovers efficiently a wide range of spatial frequencies of the phase that can be further extended by simple iterative refinement. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Keywords:
PHASE-AMPLITUDE MICROSCOPY
OF-INTENSITY-EQUATION
FLIPPING ALGORITHM
TRANSPORT
RECONSTRUCTION
HOLOGRAPHY
RETRIEVAL
FIELDS
NOISE
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Optics Express cover
Optics Express
IF:
3.3
Papers:
6.1W
Citations:
14.3W

Organization

H
Humboldt University of Berlin
Scholars:
3.2W
Papers: 2.7W
Citations: 47