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Multi-parametric interferometric reflectance imaging sensor
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DOI：10.1038/s41598-026-45282-x.png)
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Abstract
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We present a dual-wavelength, multi-parametric Interferometric Reflectance Imaging Sensor (MP-IRIS) for real-time, label free, multiplexed binding kinetic measurements without the “bulk-effect”. Our platform dynamically tracks the conditions of the solution and corrects in real time, demonstrating a reduction in bulk effect to 3 pg/mm$$\vphantom{0}^2$$ with bulk refractive index change of $$10^{-3}$$ RIU. By incorporating multi-wavelength data acquisition, we improve the repeatability and reduce quantification error due to variation in chip manufacturing and surface treatment. Proof-of-concept DNA hybridization assays validate accurate, multiplexed binding measurements under diverse chip conditions. MP-IRIS retains the high sensitivity of prior IRIS designs, lowering the overall complexity of the system and offering potential applications in small-molecule analysis.
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Engineering
Optics and photonics
Science
Humanities and Social Sciences
multidisciplinary
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