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Multi-phase image modelling with excursion sets

delete2000-01-01
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PRE
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D
David J. Nott
R
Richard J. Wilson
DOI:10.1016/S0165-1684(99)00116-4delete
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Abstract

Abstract

En 中文
Excursion sets of random fields, which are obtained by truncating a random field at some level, can be used to define random set models for binary images. We discuss some image models based on excursion sets which are appropriate for multi-phase image data. Parameter estimation for the multi-phase models is discussed, and the methods are applied to some images of core samples of sulphide ores. (C) 2000 Elsevier Science B.V. All rights reserved.
Keywords:
excursion set
random field
image processing
random set
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Journal

Signal Processing cover
Signal Processing
IF:
3.6
Papers:
9.9K
Citations:
1.7W

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