Multi-wavelength multi-angle reflection tomography

Ting Zhang

doi:10.1364/OE.26.026093

Multi-wavelength multi-angle reflection tomography

2018-09-21

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AI

DOI：10.1364/OE.26.026093

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We have developed a reflection tomographic microscope in which the sample is reconstructed from different holograms recorded under various angles and wavelengths of incidence. We present an iterative inversion algorithm based on a rigorous modeling of the wave-sample interaction that processes all the data simultaneously to estimate the sample permittivity distribution. We show that using several wavelengths permits a significant improvement of the reconstruction, especially along the optical axis. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Keywords:

OPTICAL COHERENCE TOMOGRAPHY

DIGITAL HOLOGRAPHIC MICROSCOPY

DIFFRACTIVE MICROSCOPY

ISOTROPIC RESOLUTION

SUPERRESOLUTION

Multi-wavelength multi-angle reflection tomography

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