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Multiple-instance discriminant analysis

delete2014-07-01
delete9
PRE
AI
柴晶 (Jing Chai) *
X
Xinghao Ding
H
Hongtao Chen
T
Tingyu Li
DOI:10.1016/j.patcog.2014.02.002delete
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Abstract

Abstract

En 中文
Multiple-instance discriminant analysis (MIDA) is proposed to cope with the feature extraction problem in multiple-instance learning. Similar to MidLABS, MIDA is also derived from linear discriminant analysis (LDA), and both algorithms can be treated as multiple-instance extensions of LDA. Different from MidLABS which learns from the bag level, MIDA is designed from the instance level. MIDA consists of two versions, i.e., binary-class MIDA (B-MIDA) and multi-class MIDA (M-MIDA), which are utilized to cope with binary-class (standard) and multi-class multiple-instance learning tasks, respectively. The block coordinate ascent approach, by which we seek positive prototypes (the most positive instance in a positive bag is termed as the positive prototype of this bag) and projection vectors alternatively and iteratively, is proposed to optimize B-MIDA and M-MIDA to obtain lower dimensional transformation subspaces. Extensive experiments empirically demonstrate the effectiveness of B-MIDA and M-MIDA in extracting discriminative components and weakening class-label ambiguities for instances in positive bags. (C) 2014 Elsevier Ltd. All rights reserved.
Keywords:
Multiple-instance learning
Feature extraction
Dimensionality reduction
Block coordinate ascent
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Journal

Pattern Recognition cover
Pattern Recognition
IF:
7.6
Papers:
1.3W
Citations:
4.5W

Organization

T
Taiyuan University of Technology
Scholars:
2.2W
Papers: 1.4W
Citations: 1.8W
X
xiamen university
Scholars:
5.8W
Papers: 3.7W
Citations: 67