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Multiple scattering limit in optical microscopy

delete2017-11-07
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OA
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A
Amaury Badon
B
Boccara, A. Claude
L
Lerosey, Geoffroy
M
Mathias Fink
A
Alexandre Aubry *
DOI:10.1364/OE.25.028914delete
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Abstract

Abstract

En 中文
Optical microscopy offers a unique insight of biological structures with a sub-micrometer resolution and a minimum invasiveness. However, the inhomogeneities of the specimen itself can induce multiple scattering of light and optical aberrations which limit the observation to depths close to the surface. To predict quantitatively the penetration depth in microscopy, we theoretically derive the single-to-multiple scattering ratio in reflection. From this key quantity, the multiple scattering limit is deduced for various microscopic imaging techniques such as confocal microscopy, optical coherence tomography and related methods. (C) 2017 Optical Society of America
Keywords:
COHERENCE TOMOGRAPHY
WEAK-LOCALIZATION
LIGHT
FIELD
BACKSCATTERING
ILLUMINATION
ABERRATIONS
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Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Optics Express cover
Optics Express
IF:
3.3
Papers:
6.1W
Citations:
14.3W

Organization

C
centre national de la recherche scientifique (cnrs)
Scholars:
24.5W
Papers: 18.2W
Citations: 279
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