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Multiplexed wavefront sensing with a thin diffuser
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DOI：10.1364/OPTICA.500780.png)
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Abstract
En 中文
In astronomy or biological imaging, refractive index inhomogeneities of, e.g., atmosphere or tissues, induce optical aberrations that degrade the desired information hidden behind the medium. A standard approach consists of measuring these aberrations with a wavefront sensor (e.g., Shack-Hartmann) located in the pupil plane, and compensating for them either digitally or by adaptive optics with a wavefront shaper. However, in its usual implementation this strategy can only extract aberrations within a single isoplanatic patch, i.e., a region where the aberrations remain correlated. This limitation severely reduces the effective field -of -view in which the correction can be performed. Here, we propose a wavefront sensing method capable of measuring, in a single shot, various pupil aberrations corresponding to multiple isoplanatic patches. The method, based on a thin diffuser (i.e., a random phase mask), exploits the dissimilarity between different speckle regions to multiplex several wavefronts incoming from various incidence angles. We present proofof -concept experiments carried out in widefield fluorescence microscopy. A digital deconvolution procedure in each isoplanatic patch yields accurate aberration correction within an extended field -of -view. This approach is of interest for adaptive optics applications as well as diffractive optical tomography. (c) 2024 Optica Publishing Group under the terms of the
Keywords:
FIELD-OF-VIEW
CONJUGATE ADAPTIVE OPTICS
WIDE-FIELD
MICROSCOPY
RESOLUTION
PHASE
LIGHT
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8.5
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2.4K
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