arrow
Return

Multiscale Surface Roughness for Improved Soil Moisture Estimation

delete2020-08-01
delete19
PRE
AI
M
Maheshwari Neelam *
A
Andreas Colliander
B
Binayak P. Mohanty
M
Michael H. Cosh
S
Sidharth Misra
T
Thomas J. Jackson
DOI:10.1109/TGRS.2019.2961008delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
Surface roughness parameterization plays an important role in passive microwave soil moisture (SM) retrieval. This article proposes a new formulation for estimating surface roughness. The proposed model incorporates the field-scale (micro) roughness as well as topographic (macro) roughness. The performance of the model is evaluated by inverting the traditional tau-omega model for retrieving SM. The study focuses on the passive active L-band system (PALS) radiometer data collected as a part of two Soil Moisture Active Passive Validation Experiment (SMAPVEX), i.e., SMAPVEX12 (humid Manitoba, Canada) and SMAPVEX15 (semiarid Arizona, USA) with highly different microroughness and macroroughness. The measured surface roughness is observed to increase exponentially with clay fraction (CF). This behavior is minimized with increase in leaf area index (LAI). In the absence of vegetation, the contribution of topography toward surface roughness increases. A higher surface roughness value is estimated for SMAPVEX12, which positively correlate with LAI and CF and negatively correlate with wetness conditions. On the other hand, due to the high topographic variability in SMAPVEX15 region, the contribution of topography (surface curvature) toward total surface roughness is significant. Also, consistently dry SM resulted in high microroughness for SMAPVEX15. Nevertheless, a total surface roughness estimated for SMAPVEX15 region is less than for SMAPVEX12. The surface roughness formulation presented in this study can be extrapolated to any spatial resolution.
Keywords:
Passive microwave
soil moisture (SM)
soil moisture active passive (SMAP)
surface roughness
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

IEEE Transactions on Geoscience and Remote Sensing cover
IEEE Transactions on Geoscience and Remote Sensing
IF:
8.6
Papers:
2.1W
Citations:
10.7W

Organization

C
California Institute of Technology
Scholars:
2.9W
Papers: 2.5W
Citations: 4.9W
N
national aeronautics & space administration (nasa)
Scholars:
3.1W
Papers: 2.6W
Citations: 46
N
NASA Goddard Space Flight Center
Scholars:
1.0W
Papers: 7.7K
Citations: 16
researcher View more organizations