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Non-Destructive Quantitative Characterization of Constituent Content in C/C–SiC Composites Based on Multispectral Photon-Counting X-Ray Detection
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DOI：10.3390/s26082331.png)
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Abstract
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Keywords:
C/C–SiC composites
photon-counting detector (PCD)
multispectral X-ray detection
non-destructive characterization
effective atomic number (<I>Z</I><sub>eff</sub>)
constituent inversion
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