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Non-Destructive Surface Characterization Using Microscopic Imaging and Data Modeling
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DOI：10.3390/ma18184376.png)
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Abstract
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This article presents a novel method for converting a digital image of a conductive surface into its three-dimensional spatial representation. The developed approach utilizes a mathematical transformation of pixel intensity to the height value of the represented point. The method includes interpolation, automatic image segmentation, and predictive reconstruction of surface profiles, which significantly improves the quality of material surface representation. The method was implemented in a 3D model of a conductive structure created in the physical vacuum deposition method, and its capabilities were demonstrated using examples of simulations of the electric field distribution within and on the surface of the tested sample.
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