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Non-destructuve 3D microstructure mapping for large samples with complex microstructure
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DOI：10.1080/21663831.2025.2591884.png)
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Abstract
En 中文
Scanning 3D x-ray diffraction is a non-destructive synchrotron technique for mapping the 3D microstructure of polycrystalline materials where a focused hard x-ray beam is scanned across the sample to obtain spatially-resolved microstructure information. We demonstrate a new approach to such an experiment which extends the capabilities of existing techniques to be able to handle more complex and highly deformed microstructures. We demonstrate this by mapping the formation of sub micro meter sized deformation twins in-situ and in the bulk at deformation levels up to 20% in an as-built additively manufactured steel sample.
Keywords:
Three-dimensional X-ray diffraction
additive manufacturing
plasticity
Journal
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7.9
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1.1K
Citations:
6.4K