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Optimal selective Huffman coding for test-data compression

delete2007-08-01
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Xrysovalantis Kavousianos *
E
Emmanouil Kalligeros
D
Dimitris Nikolos
DOI:10.1109/TC.2007.1057delete
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Abstract

Abstract

En 中文
Selective Huffman coding has recently been proposed for efficient test-data compression with low hardware overhead. In this paper, we show that the already proposed encoding scheme is not optimal and we present a new one, proving that it is optimal. Moreover, we compare the two encodings theoretically and we derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression. In terms of hardware overhead, the new scheme is at least as low-demanding as the old one. The increased compression efficiency, the resulting test-time savings, and the low hardware overhead of the proposed method are also verified experimentally.
Keywords:
embedded testing techniques
IP cores
selective Huffman coding
test-data compression

Journal

IEEE Transactions on Computers cover
IEEE Transactions on Computers
IF:
3.8
Papers:
5.4K
Citations:
9.8K

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