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Optimizing µ-EDXRF spectra: A new approach for automatic diffraction identification and correction with implications on chemical quantification and grain identification
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DOI：10.1016/j.sab.2026.107517.png)
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Abstract
En 中文
The technology of energy dispersive Micro X-ray fluorescence (& micro;-EDXRF) mapping is a valuable analytical technique across many scientific disciplines. It allows the rapid acquisition of both chemical and textural data while requiring minimal sample preparation. Its ability to analyze large and heterogeneous samples makes it particularly well-suited for application in the geosciences for investigating various rock types and mineralogical environments. However, on crystalline samples the diffraction of the X-ray beam at the crystal lattice can create peaks overlapping with other element peaks, which makes quantification and interpretation of element distribution maps difficult. Therefore, a new approach to correct such diffraction peaks and preserve element peaks is presented using the different signals of different detectors to identify and subtract the diffraction portion in the spectrum. It is compared to five existing methods for diffraction removal. The results show that the introduced 'modified sum' approach is highly capable of retaining element peaks and correcting diffraction peaks fast at low computational costs. Furthermore, the identification of diffraction peaks allows for separation of single grains within a mono-mineralic domain of grains using their different crystallographic orientations. This can provide information on magmatic processes, which is illustrated by an example of a magnetitite layer from the Upper Zone of the South African Bushveld Complex.
Keywords:
& micro
-EDXRF
M4 tornado
Diffraction
XRF-imaging
Grain size
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