arrow
Return

Oxide-based RRAM materials for neuromorphic computing

delete2018-02-20
delete241
PRE
AI
X
XiaoLiang Hong
D
Desmond JiaJun Loy
P
Putu Andhita Dananjaya
F
Funan Tan
C
CheeMang Ng
W
WenSiang Lew *
DOI:10.1007/s10853-018-2134-6delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
In this review, a comprehensive survey of different oxide-based resistive random-access memories (RRAMs) for neuromorphic computing is provided. We begin with the history of RRAM development, physical mechanism of conduction, fundamental of neuromorphic computing, followed by a review of a variety of RRAM oxide materials (PCMO, HfOx, TaOx, TiOx, NiOx, etc.) with a focus on their application for neuromorphic computing. Our goal is to give a broad review of oxide-based RRAM materials that can be adapted to neuromorphic computing and to help further ongoing research in the field.
Keywords:
RESISTIVE SWITCHING BEHAVIOR
TIMING-DEPENDENT PLASTICITY
LONG-TERM POTENTIATION
MEMORY DEVICES
HIGH-SPEED
THIN-FILM
LOW-POWER
IMPLEMENTATION
RESISTANCE
SYNAPSE
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Journal of Materials Science cover
Journal of Materials Science
IF:
3.9
Papers:
3.2W
Citations:
7.2W

Organization

N
Nanyang Technological University
Scholars:
4.9W
Papers: 4.8W
Citations: 8.1W
Cited Papers

Cited Papers

High speed resistive switching in Pt/TiO2/TiN film for nonvolatile memory application
err2007-11-29
err283
PREAI
errYoshida, Chikako; Tsunoda, Kohji; Noshiro, Hideyuki; Sugiyama, Yoshihiro
errShare
errSave
errShare
errSave
Electrokinetic Transport in Natural Soil Cores
err1997-01-01
err0
PREAI
errDouglas I. Stewart; L. Jared West; S. Richard Johnston; Andrew M. Binley
errShare
errSave
Abstract 14
err2022-12-01
err0
errOAAI
errDeepti Sharma; Sandeep Mathur; Balram Sharma; Sanjay Saran
errShare
errSave
errShare
errSave
Resistive Random Access Memory (ReRAM) Based on Metal Oxides
err2010-12-01
err903
PREAI
errAkinaga, Hiroyuki; Shima, Hisashi
errShare
errSave
researcher View more