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Partial label learning via identifying outlier features
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AI
DOI：10.1016/j.knosys.2024.112278.png)
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Abstract
En 中文
Partial label learning (PLL) is a classification problem where each training instance is ambiguously annotated with a set of candidate labels, among which only one is the ground truth label. The topological structure in the feature space is frequently used by existing PLL approaches to clarify if a candidate label is the ground truth label for a training example. However, these techniques frequently experience cumulative errors brought on by the error-prone labeling confidence estimate throughout the topological structure because of the redundant and noisy features occurring naturally in the feature space. In this paper, we propose a novel approach through Identifying Outlier Features (PL-IOF) to address this challenge. The feature space is decomposed into class prototype features and outlier features, where the former captures the discriminative features of each class prototype, and the latter captures the outlier features in each training instance. A unified framework is specifically suggested to simultaneously optimize class prototypes and outlier features, as well as to estimate labeling confidences over incomplete label training instances. This framework ensures the high quality of the extracted class prototypes by recognizing the outliers. Experiments on both synthetic and real-world datasets demonstrate the out-performance of PL-IOF over the state-of-the-art.
Keywords:
Partial label learning
Label prototype
Outlier features
Disambiguation
Journal
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