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Persistent Scatterer Pixel Selection Method Based on Multi-Temporal Feature Extraction Network

delete2025-09-29
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OA
AI
Z
Zihan Hu
M
Mofan Li
G
Gen Li *
Y
Yifan Wang
C
C.T. Sun
Z
Zehua Dong
DOI:10.3390/rs17193319delete
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Abstract

Abstract

En 中文
Persistent scatterer (PS) pixel selection is crucial in the PS-InSAR technique, ensuring the quality and quantity of PS pixels for accurate deformation measurements. However, traditional methods like the amplitude dispersion index (ADI)-based method struggle to balance the quality and quantity of PS pixels. To adequately select high-quality PS pixels, and thus improve the deformation measurement performance of PS-InSAR, the multi-temporal feature extraction network (MFN) is constructed in this paper. The MFN combines the 3D U-Net and the convolutional long short-term memory (CLSTM) to achieve time-series analysis. Compared with traditional methods, the proposed MFN can fully extract the spatiotemporal characteristics of complex SAR images to improve PS pixel selection performance. The MFN was trained with datasets constructed by reliable PS pixels estimated by the ADI-based method with a low threshold using ∼350 time-series Sentinel-1A SAR images, which contain man-made objects, farmland, parkland, wood, desert, and waterbody areas. To test the validity of the MFN, a deformation measurement experiment was designed for Tongzhou District, Beijing, China with 38 SAR images obtained by Sentinel-1A. Moreover, the similar time-series interferometric pixel (STIP) index was introduced to evaluate the phase stability of selected PS pixels. The experimental results indicate a significant improvement in both the quality and quantity of selected PS pixels, as well as a higher deformation measurement accuracy, compared to the traditional ADI-based method.
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Journal

Remote Sensing cover
Remote Sensing
IF:
4.1
Papers:
7.7K
Citations:
15.1W

Organization

B
beijing institute of technology
Scholars:
5.5W
Papers: 4.0W
Citations: 63
I
Institute of Remote Sensing Satellite
Scholars:
31
Papers: 23
Citations: 0
Cited Papers

Cited Papers

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err2018-02-01
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errNachmani, Eliya; Marciano, Elad; Lugosch, Loren; Gross, Warren J.; Burshtein, David; Be'ery, Yair
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