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Phase measuring deflectometry based microscopy for shape visualization and thickness quantification
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DOI：10.1016/j.optlastec.2025.113524.png)
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Abstract
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• PMD microscopy setup uses smartphone display and lens for fringe pattern demagnification. • Calibration with microspheres computes scaling factor K for thickness measurements. • Thickness profiles match DHM results, confirming PMD accuracy. • PMD achieves ∼9.6 nm longitudinal accuracy with reduced noise and artifacts. • System measures transparent microspheres, RBCs, and pollen seeds effectively.
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PROCEEDINGS OF THE IEEE
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PROCEEDINGS OF THE IEEEIF25.9
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