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Phase measuring deflectometry based microscopy for shape visualization and thickness quantification

delete2025-07-07
delete0
PRE
AI
S
Shivam Sharma
V
Vismay Trivedi
S
Swapnil Mahajan
G
Gyanendra Sheoran
B
Bahram Javidi
S
Subhash Utadiya
DOI：10.1016/j.optlastec.2025.113524delete
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Abstract

Abstract

En 中文
• PMD microscopy setup uses smartphone display and lens for fringe pattern demagnification. • Calibration with microspheres computes scaling factor K for thickness measurements. • Thickness profiles match DHM results, confirming PMD accuracy. • PMD achieves ∼9.6 nm longitudinal accuracy with reduced noise and artifacts. • System measures transparent microspheres, RBCs, and pollen seeds effectively.

Journal

O
Optics and Laser Technology
IF:
5
Papers:
1.9K
Citations:
3.5W

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