.png){kind=icon}
Return
Phase reconstruction using fast binary 4D STEM data
.png){kind=icon}
OA
AI
DOI：10.1063/1.5143213.png)
.png){kind=icon}
.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
We report the application of focused probe ptychography using binary 4D datasets obtained using scanning transmission electron microscopy (STEM). Modern fast pixelated detectors have enabled imaging of individual convergent beam electron diffraction patterns in a STEM raster scan at frame rates in the range of 1000-8000Hz using conventional counting modes. Changing the bit depth of a counting detector, such that only values of 0 or 1 can be recorded at each pixel, allows one to decrease the dwell time and increase the frame rate to 12.5kHz, reducing the electron exposure of the sample for a given beam current. Atomically resolved phase contrast of an aluminosilicate zeolite (ZSM-5) is observed from sparse diffraction patterns with isolated individual electrons, demonstrating the potential of binary ptychography as a low-dose 4D STEM technique.
Keywords:
TRANSMISSION ELECTRON-MICROSCOPY
RESOLUTION
CONTRAST
PTYCHOGRAPHY
LIMIT
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.
Journal
IF:
3.6
Papers:
10.4W
Citations:
17.8W
Organization
Cited Papers
Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector.png)
SCIENTIFIC REPORTSOAAI
SCIENTIFIC REPORTSIF3.9
OAAIShareSaveShareSave
ShareSaveImaging defects and their evolution in a metal-organic framework at sub-unit-cell resolutionNATURE CHEMISTRYOAAI
NATURE CHEMISTRYIF20.2
OAAIShareSaveShareSavePtychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imagingNATURE COMMUNICATIONSOAAI
NATURE COMMUNICATIONSIF15.7
OAAIShareSaveShareSave
View more