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Precise determination of oxygen content in SmBa2Cu3O7-δ thin film samples using x-ray diffraction
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DOI：10.1088/1361-6668/ad4a30.png)
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Abstract
En 中文
The superconducting properties of SmBa2Cu3O7-delta (SmBCO) thin films are predominantly influenced by the oxygen deficiency delta. Yet, the established methods to determine delta such as iodometric titration or thermogravimetry cannot be applied to thin films due to their very small volume. Therefore, an alternative way to determine delta for SmBCO thin film samples using x-ray diffraction (XRD) is presented. Main point of this analysis is the structural relationship between the a, b and c lattice parameters and delta. A linear relationship between c and delta is found in SmBCO powder samples for both the orthorhombic and tetragonal phase. Furthermore, an attempt is made to quantify the chemical composition using time-of-flight secondary ion mass spectrometry. This attempt was inconclusive because of drastically changing ion yields due to delta influencing the valence state of the analyzed ions. The crystal structural relationship gathered from the powder samples is applied to thin film samples. Thereby, it becomes clear that thermal strain is affecting the crystal structure of the thin films. A simple correction model is used to correct for thermal strain and a good match between powder, literature, and thin film data is achieved and thus a non-destructive way for the determination of delta using XRD.
Keywords:
SmBCO
CSD
oxygen deficiency
XRD
Journal
IF:
4.2
Papers:
8.3K
Citations:
1.2W