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Probing higher order optical modes in all-dielectric nanodisk, -square, and -triangle by aperture type scanning near-field optical microscopy
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DOI：10.1515/nanoph-2021-0612.png)
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Abstract
En 中文
All-dielectric nanoantennas, consisting of high refractive index semiconductor material, are drawing a great deal of attention in nanophotonics. Owing to their ability to manipulate efficiently the flow of light within sub-wavelength volumes, they have become the building blocks of a wide range of new photonic metamaterials and devices. The interaction of the antenna with light is largely governed by its size, geometry, and the symmetry of the multitude of optical cavity modes it supports. Already for simple antenna shapes, unraveling the full modal spectrum using conventional far-field techniques is nearly impossible due to the spatial and spectral overlap of the modes and their symmetry mismatch with incident radiation fields. This limitation can be circumvented by using localized excitation of the antenna. Here, we report on the experimental near-field probing of optical higher order cavity modes (CMs) and whispering gallery modes (WGMs) in amorphous silicon nanoantennas with simple, but fundamental, geometrical shapes of decreasing rotational symmetry: a disk, square, and triangle. Tapping into the near-field using an aperture type scanning near-field optical microscope (SNOM) opens a window on a rich variety of optical patterns resulting from the local excitation of antenna modes of different order with even and odd parity. Numerical analysis of the antenna and SNOM probe interaction shows how the near-field patterns reveal the node positions of - and allows us to distinguish between - cavity and whispering gallery modes. As such, this study contributes to a richer and deeper characterization of the structure of light in confined nanosystems, and their impact on the structuring of the light fields they generate.
Keywords:
all-dielectric nanophotonics
cavity and whispering gallery modes
higher order modes
nanoantenna
odd and even symmetry
scanning near-field optical microscopy
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