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Ptychographic microscope for three-dimensional imaging
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DOI：10.1364/OE.22.012513.png)
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Abstract
En 中文
Ptychography is a coherent imaging technique that enables an image of a specimen to be generated from a set of diffraction patterns. One limitation of the technique is the assumption of a multiplicative interaction between the illuminating coherent beam and the specimen, which restricts ptychography to samples no thicker than a few tens of micrometers in the case of visible-light imaging at micron-scale resolution. By splitting a sample into axial sections, we demonstrated in recent work that this thickness restriction can be relaxed and whats-more, that coarse optical sectioning can be realized using a single ptychographic data set. Here we apply our technique to data collected from a modified optical microscope to realize a reduction in the optical sectioning depth to 2 m in the axial direction for samples up to 150 m thick. Furthermore, we increase the number of sections that are imaged from 5 in our previous work to 34 here. Our results compare well with sectioned images collected from a confocal microscope but have the added advantage of strong phase contrast, which removes the need for sample staining. (C) 2014 Optical Society of America
Keywords:
ELECTRON-MICROSCOPY
DIFFRACTION
INFORMATION
SCATTERING
ERRORS
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