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Quantitative comparison between two geometrical layouts for diffraction enhanced imaging

delete2007-07-01
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黄万霞 cover
黄万霞 (Wanxia Huang)
Q
Qingxi Yuan
P
Peiping Zhu
J
Junyue Wang
H
Hang Shu
陈波 (Bo Chen)
T
Tiandou Hu
Z
Ziyu Wu *
DOI:10.1016/j.sab.2007.04.001delete
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Abstract

Abstract

En 中文
Diffraction enhanced imaging (DEI) with two crystals has been performed at the 4WIA beamline at Beijing Synchrotron Radiation Facility (BSR-F). Two different crystal geometrical layouts were used to collect images, in the first layout the rotation axis of the crystal has been set perpendicular to the orbital plane while in the second the axis is parallel to the orbital plane. Performance comparison between the two layouts is discussed in terms of thermal expansion of the crystal induced by the heat load, imaging homogeneity, spatial resolution and angular resolution. From both experimental and theoretical data we show that the best images may be obtained with the optical layout in which the rotation axis of the crystals is perpendicular to the orbital plane. (c) 2007 Published by Elsevier B.V.
Keywords:
synchrotron radiation
phase contrast imaging
crystal diffraction
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Spectrochimica Acta Part B-Atomic Spectroscopy cover
Spectrochimica Acta Part B-Atomic Spectroscopy
IF:
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