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Quantum metrology with linear Lie algebra parameterizations
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DOI：10.1103/PhysRevResearch.6.043137.png)
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Abstract
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Lie algebraic techniques are powerful and widely used tools for studying dynamics and metrology in quantum optics. When the Hamiltonian generates a Lie algebra with finite dimension, the unitary evolution can be expressed as a finite product of exponentials using the Wei-Norman expansion. The system is then exactly described by a finite set of scalar differential equations, even if the Hilbert space is infinite. However, the differential equations provided by the Wei-Norman expansion are nonlinear and often have singularities that prevent both analytic and numerical evaluation. We derive a new Lie algebra expansion for the quantum Fisher information, which results in linear differential equations. Together with existing Lie algebra techniques this allows many metrology problems to be analysed entirely in the Heisenberg picture. This substantially reduces the calculations involved in many metrology problems, and provides analytical solutions for problems that cannot even be solved numerically using the Wei-Norman expansion. It also allows us to study general features of metrology problems, valid for all quantum states. We provide detailed examples of these methods applied to problems in quantum optics and nonlinear optomechanics.
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