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Rapid embedded system testing using verification patterns

delete2005-07-01
delete21
PRE
AI
W
Wei‐Tek Tsai
L
Lian Yu
Z
Zhu, P
P
Paul, B
DOI：10.1109/MS.2005.103delete
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Abstract

Abstract

En 中文
A verification pattern approach for rapidly testing real-time embedded systems first classifies system scenarios into patterns. For each scenario pattern, the VP approach then develops a test script template for all the scenarios belonging to that pattern. In this way, instead of developing numerous scripts to test the system, test engineers can customize and reuse a set of script templates to test the entire application, saving significant effort and time.

Journal

IEEE Software cover
IEEE Software
IF:
3
Papers:
3.1K
Citations:
3.6K

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No organization information available