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Reflection second harmonic generation scanning microscope
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DOI：10.1016/S0379-6779(01)00609-9.png)
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Abstract
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We present a simple microscopy set-up towards the spatial mapping of second harmonic generation of non-linear structures. The sample surface is scanned through a microscope objective by an off-axis incident nanosecond Nd:YAG fundamental laser beam. The incident fundamental and reflected harmonic beams are collected by the same objective, which allows a close scan of the surface by using high amplification objectives. The scan of different organic material-based structures will be presented, showing a second harmonic intensity cartography of active materials like oriented DR1-PMMA electrooptic polymer and MNA crystals, with micron-scale resolution. This simple set-up provides a useful and compact tool to characterize non-linear active domains, in order to gain insight on materials as well as on functional properties of different polymer-based structures. Moreover, with appropriate selection of incident and reflected polarization states, different components of the d(ijk) tensor can be singled-out and lead to microscopic information on molecular organization and local variations. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords:
second harmonic generation
non linear microscopy
electrooptic polymers
Journal
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4.6
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1.4W
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1.3W
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