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Reflectometry based on a frequency-shifted interferometer using sideband interference

delete2013-03-21
delete16
PRE
AI
B
Bing Qi *
叶非 (Fei Ye)
L
Li Qian
H
Hoi‐Kwong Lo
DOI:10.1364/OL.38.001083delete
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Abstract

Abstract

En 中文
Frequency-shifted interferometry has shown great potential in optical fiber sensor multiplexing. In this letter, we propose and demonstrate a frequency-shifted interferometer (FSI) based on sideband interference. Comparing with previous implementation of FSI based on a Sagnac interferometer, this scheme is much simpler and compact. By scanning the driving frequency of a LiNbO3 phase modulator in the range of 4.5-5.5 GHz, we demonstrate a spatial resolution of 0.1 m, which is 50 times better than the previously reported results. (C) 2013 Optical Society of America
Keywords:
FIBER
SENSORS
WAVELENGTH
ARRAY
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Journal

Optics Letters cover
Optics Letters
IF:
3.3
Papers:
4.0W
Citations:
7.6W

Organization

U
university of toronto
Scholars:
14.7W
Papers: 12.0W
Citations: 165