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RELIABILITY ANALYSIS OF SUGAR MILL PLANT USING BOOLEAN FUNCTION AND PATH TRACING METHODS
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DOI：10.59467/IJASS.2025.21.605.png)
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Abstract
En 中文
This paper analyses the reliability of a sugar mill plant's system using the well-known Boolean function technique and path tracing method. The system is considered non-repairable and comprises seven subsystems connected in series. The 5th Sub-System contains three components connected in parallel, with one component initially active and the other two in standby mode. Subsystem six includes two parallel components, with one initially active and the other in standby mode. The remaining subsystems each consists of a single component. All components are non-identical and the failure rates of the components follow Weibull distribution. The study derives expressions for the reliability measures of both identical and nonidentical components. Reliability and Mean time to system failure (MTSF) values are computed for different scale and shape parameters in the Weibull distribution. The results are analyzed and presented graphically, providing valuable insights into the system's performance and reliability under different conditions.
Keywords:
Sugar mill plant
Boolean technique
Path tracing method
Weibull distribution
Journal
I
IF:
0.1
Papers:
36
Citations:
0