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Research on a Mass Measurement System Based on Digital Speckle Pattern Interferometry
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DOI：10.3788/gzxb20265505.0512001.png)
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Abstract
En 中文
This paper proposes a mass measurement method based on Digital Speckle Pattern Interferometry (DSPI). The mass measurement is realized by measuring the in-plane displacement produced by the elastomer under load. The research focuses on verifying the feasibility, sensitivity, measurement range and stability analysis of the mass measurement system based on Digital Speckle Pattern Interferometry in the context of high static loads. In this paper, a non-contact mass measurement system based on Digital Speckle Pattern Interferometry (DSPI) technology is designed and constructed, which combines an in-plane Digital Speckle Pattern Interferometry (DSPI) measurement optical path with a double-shear-beam elastomer structure, to realize high-precision measurements of small deformations of elastomers under load. The elastomer adopts a symmetric double-shear beam structure, which is dominated by shear deformation under applied load, thus effectively suppressing the bending deformation and deformation components, and improving the stability and consistency of deformation measurement under high static load background. The elastomer surface is used as an optical measurement object to provide a stable scattering field distribution for in-plane displacement measurement. The experimental system uses a coherent laser with a center wavelength of 532 nm as the light source, and the laser is split and reflected to form two beams with the same irradiation angle, which are uniformly irradiated to the elastomer surface. The diffusely reflected light from the elastomer surface interferes with the target surface of the CCD camera to form a scattered interference image. The phase is extracted by introducing a piezoelectric ceramic actuator in the reference optical path, and the phase shift is generated by applying a precisely controlled voltage signal with equal time steps. A four-step phase-shift algorithm is used to process the scattering interferograms collected under different phase-shift states. After the phase distribution is obtained, the phase difference is calculated from the phase diagrams before and after loading, and combined with the geometrical relationship of the in-plane interferometry, the phase change is converted into the in-plane displacement information of the elastomer shear-sensitive region. In order to reduce the noise interference and improve the measurement accuracy, the phase image is sequentially subjected to effective region cropping, filter processing and phase unwrapping operation quantities. In the experimental verification stage, standard masss of different mass levels are used as known loads to load the elastomer step by step to systematically evaluate the correspondence between the mass change and the measured in-plane deformation. The minimum resolvable mass and sensitivity of the system are verified by small mass loading experiments, and the linear response characteristics and measurement range of the system are tested by large mass step-by-step loading experiments. Meanwhile, multiple repetitive loading experiments are carried out in a fixed static loading background and a deformation-to-mass calibration model is established to evaluate the repeatability, stability, and reliability of the system's deformation-to-mass conversion under high static loading conditions. The experimental results show that there is a linear correspondence between the mass of the applied mass and the deformation in the elastomer surface in the mass measurement system of this paper.The system shows a significant response to 1 g mass change, verifying its better than 1 g mass resolution. In the repeated loading experiments with micro loads of 0 similar to 10 g, the deformation shows a good linear relationship with the mass change, and the results of multiple experiments are highly consistent, which indicates that the system has a high repeatability and stability in measuring micro masss. In the maximum 6 000 g large load test, the measured deformation still maintains a good linear relationship with the loaded mass, and its linear goodness of fit reaches 0.996 47, which shows the stable measurement performance of the system in a large range. The results of the calibration experiments show that the deformation-mass relationship is highly linear in the range of 0 similar to 150 g under the background of 1 kg static load, and the average errors of multiple repetitions of the experiments fluctuate slightly around the zero value, which verifies the stability and consistency of the system for small mass measurements under high static load conditions. The proposed DSPI-based mass measurement system provides high sensitivity, wide measurement range, and strong stability, demonstrating its feasibility for high-precision mass detection under high static load conditions.
Keywords:
Digital speckle pattern interferometry
Deformation measurement
Phase shifting
Mass measurement
Optical measurement
Journal
A
IF:
0.7
Papers:
105
Citations:
0