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Reverse Engineering Digital Circuits Using Structural and Functional Analyses

delete2014-03-01
delete106
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OA
AI
P
Pramod Subramanyan *
N
Nestan Tsiskaridze
李
李文超 (Wenchao Li)
A
Adrià Gascón
W
Wei Yang Tan
A
Ashish Tiwari
N
Natarajan Shankar
S
Sanjit A. Seshia
S
Sharad Malik
DOI:10.1109/TETC.2013.2294918delete
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Abstract

Abstract

En 中文
Integrated circuits (ICs) are now designed and fabricated in a globalized multivendor environment making them vulnerable to malicious design changes, the insertion of hardware Trojans/malware, and intellectual property (IP) theft. Algorithmic reverse engineering of digital circuits can mitigate these concerns by enabling analysts to detect malicious hardware, verify the integrity of ICs, and detect IP violations. In this paper, we present a set of algorithms for the reverse engineering of digital circuits starting from an unstructured netlist and resulting in a high-level netlist with components such as register files, counters, adders, and subtractors. Our techniques require no manual intervention and experiments show that they determine the functionality of >45% and up to 93% of the gates in each of the test circuits that we examine. We also demonstrate that our algorithms are scalable to real designs by experimenting with a very large, highly-optimized system-on-chip (SOC) design with over 375 000 combinational elements. Our inference algorithms cover 68% of the gates in this SOC. We also demonstrate that our algorithms are effective in aiding a human analyst to detect hardware Trojans in an unstructured netlist.
Keywords:
Digital circuits
computer security
design automation
formal verification
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Journal

IEEE Transactions on Emerging Topics in Computing cover
IEEE Transactions on Emerging Topics in Computing
IF:
5.4
Papers:
1.1K
Citations:
3.4K

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P
Princeton University
Scholars:
2.1W
Papers: 2.3W
Citations: 5.1W
U
University of California Berkeley
Scholars:
3.5W
Papers: 2.8W
Citations: 11.3W
University of California System cover
University of California System
Scholars:
37.7W
Papers: 33.8W
Citations: 6.6K
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