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Robust binary and multinomial logit models for classification with data uncertainties

delete2025-05-22
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PRE
AI
B
Baichuan Mo
郑韵含 cover
郑韵含 (Yunhan Zheng) *
X
Xiaotong Guo
R
Ruoyun Ma
J
Jinhua Zhao
DOI:10.1016/j.ejor.2025.05.013delete
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Abstract

Abstract

En 中文
• Reformulate DCMs with robust optimization for classification under test errors. • Derive robust models for binary/multinomial logits with feature and label uncertainty. • Derive statistical properties of robust estimators. • Experiments show better model accuracy and generalizability.
Keywords:
robust optimization
classification
feature uncertainty
label uncertainty
statistical properties

Journal

European Journal of Operational Research cover
European Journal of Operational Research
IF:
6
Papers:
2.2W
Citations:
6.4W

Organization

T
tsinghua university
Scholars:
11.8W
Papers: 10.0W
Citations: 137
M
Massachusetts Institute of Technology
Scholars:
2.4K
Papers: 1.1K
Citations: 8
S
Stanford University
Scholars:
9.6W
Papers: 8.2W
Citations: 17.0W
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