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delete2020-04-01
delete0
PRE
AI
H
H.‐S. Philip Wong
K
K. Akarvardar
D
D. Antoniadis
J
J. Bokor
C
C. Hu
T
T.-J. King-Liu
S
S. Mitra
J
J.D. Plummer
S
S. Salahuddin
L
L. Deng
G
G. Li
S
S. Han
L
L. Shi
Y
Yunze Xie
E
E. Yaacoub
A
Alouini, M. -S.
A
A. Douik
H
H. Dahrouj
T
Tareq Y. Al-Naffouri
M
M.-S. Alouini
DOI：10.1109/JPROC.2020.2979196delete
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Abstract

Abstract

En 中文
Since its inception, the semiconductor industry has used the physical dimension (the gate length) as a means to gauge its continuous advancement. This metric is all but obsolete today. In this month's opinion piece, the authors examine historical trends and analyze how device technology provides for benefits at the system level, and propose a new density metric. This density metric aims to capture the essential characteristics of semiconductor technologies in a holistic way and to gauge the advances of future generations.
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Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Proceedings of the IEEE cover
Proceedings of the IEEE
IF:
25.9
Papers:
9.9K
Citations:
4.5W

Organization

No organization information available