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Self-supervised learning based on discriminative nonlinear features for image classification

delete2005-06-01
delete7
PRE
AI
Q
Qi Tian
Y
Ying Wu
J
Jie Yu
T
Thomas S. Huang
DOI:10.1016/j.patcog.2004.07.013delete
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Abstract

Abstract

En 中文
For learning-based tasks such as image classification, the feature dimension is usually very high. The learning is afflicted by the curse of dimensionality as the search space grows exponentially with the dimension. Discriminant-EM (DEM) proposed a framework by applying self-supervised learning in a discriminating subspace. This paper extends the linear DEM to a nonlinear kernel algorithm, Kernel DEM (KDEM), and evaluates KDEM extensively on benchmark image databases and synthetic data. Various comparisons with other state-of-the-art learning techniques are investigated for several tasks of image classification. Extensive results show the effectiveness of our approach. (c) 2005 Pattern Recognition Society. Published by Elsevier Ltd. All rights reserved.
Keywords:
discriminant analysis
Kernel function
unlabeled data
support vector machine
image classification
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Journal

Pattern Recognition cover
Pattern Recognition
IF:
7.6
Papers:
1.3W
Citations:
4.5W

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