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Semi-Supervised Instance-Segmentation Model for Feature Transfer Based on Category Attention
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DOI：10.3390/s22228794.png)
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Abstract
En 中文
In the task of image instance segmentation, semi-supervised instance segmentation algorithms have received constant research attention over recent years. Among these algorithms, algorithms based on transfer learning are better than algorithms based on pseudo-label generation in terms of segmentation performance, but they can not make full use of the relevant characteristics of source tasks. To improve the accuracy of these algorithms, this work proposes a semi-supervised instance segmentation model AFT-Mask (attention-based feature transfer Mask R-CNN) based on category attention. The AFT-Mask model takes the result of object-classification prediction as attention to improve the performance of the feature-transfer module. In detail, we designed a migration-optimization module for connecting feature migration and classification prediction to enhance segmentation-prediction accuracy. To verify the validity of the AFT-Mask model, experiments were conducted on two types of datasets. Experimental results show that the AFT-Mask model can achieve effective knowledge transfer and improve the performance of the benchmark model on semi-supervised instance segmentation.
Keywords:
semi-supervised learning
instance segmentation
feature transfer
attention mechanism
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