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Semi-supervised object recognition based on Connected Image Transformations

delete2013-12-01
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Steven Van Vaerenbergh *
I
Ignacio Santamarı́a
P
Paolo Emilio Barbano
DOI:10.1016/j.eswa.2013.06.029delete
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Abstract

Abstract

En 中文
We present a novel semi-supervised classifier model based on paths between unlabeled and labeled data through a sequence of local pattern transformations. A reliable measure of path-length is proposed that combines a local dissimilarity measure between consecutive patters along a path with a global, connectivity-based metric. We apply this model to problems of object recognition, for which we propose a practical classification algorithm based on sequences of Connected Image Transformations (CIT). Experimental results on four popular image benchmarks demonstrate how the proposed CIT classifier outperforms state-of-the-art semi-supervised techniques. The results are particularly significant when only a very small number of labeled patterns is available: the proposed algorithm obtains a generalization error of 4.57% on the MNIST data set trained on 2000 randomly chosen patterns with only 10 labeled patterns per digit class. (C) 2013 Elsevier Ltd. All rights reserved.
Keywords:
Semi-supervised classification
Object recognition
Connectivity
Deformation models
Low-density separation
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Journal

Expert Systems with Applications cover
Expert Systems with Applications
IF:
7.5
Papers:
3.0W
Citations:
10.2W

Organization

U
Universidad de Cantabria
Scholars:
6.9K
Papers: 6.1K
Citations: 7.0K
Y
Yale University
Scholars:
6.5W
Papers: 6.0W
Citations: 10.0W
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