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Setting process control chart limits for rounded-off measurements
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DOI：10.1016/j.heliyon.2023.e13655.png)
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Abstract
En 中文
Measurements can often be imprecise and subjected to rounding-off. Typically, this rounding-off is ignored and assumed to have little to no effect. However, when the measuring scale step is not negligible, it may affect statistical control tools such as X-chart. Designing statistical process controls without considering the effects of rounding leads to high exposure to false negative re-sults. This study illustrates the effects of rounding on the X-chart and shows that the result may further deteriorate due to asymmetry (incompatibility of the process and the measuring device parameters). A new simple method to design control limits is proposed, based on maintaining the original characteristics of the chart as devised by Shewhart.
Keywords:
Quality control
Statistical process control
Measurement
Rounding error
Round-off
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