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SiC Integrated Circuit Control Electronics for High-Temperature Operation

delete2015-05-01
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PRE
AI
M
Mihaela Alexandru *
V
V. Banu
X
X. Jordà
J
J. Montserrat
M
M. Vellvehı́
D
Dominique Tournier
J
José del R. Millán
P
Philippe Godignon
DOI:10.1109/TIE.2014.2379212delete
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Abstract

Abstract

En 中文
This paper is an important step toward the development of complex integrated circuit (IC) control electronics that have to attend to high-temperature environment power applications. We present in premiere a prototype set of essential mixed-signal ICs on SiC capable of controlling power switches and a lateral power MESFET able to operate at high temperatures, all embedded on the same chip. Also, we report for the first time the functionality of standard Si-CMOS topologies on SiC for the master-slave data flip-flop (FF) and data-reset FF digital building blocks designed with MESFETs. Concretely, we present the complete development of SiC-MESFET IC circuitry, able to integrate gate drivers for SiC power devices. This development is based on the mature and stable Tungsten-Schottky interface technology used for the fabrication of stable SiC Schottky diodes for the European Space Agency Mission BepiColombo.
Keywords:
Digital integrated circuits (ICs)
driver
high density
high power
high temperature
integrated circuits
MESFET
mixed signal
silicon carbide (SiC)
voltage reference
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Journal

IEEE Transactions on Industrial Electronics cover
IEEE Transactions on Industrial Electronics
IF:
7.2
Papers:
1.8W
Citations:
9.8W

Organization

C
consejo superior de investigaciones cientificas (csic)
Scholars:
8.8W
Papers: 8.5W
Citations: 125