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Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset

delete2025-08-01
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PRE
AI
Z
Zhan Zheyu
H
Hainan Liu
D
Duoli Li
M
Ma Quangang
Z
Zhao Wenxin
Y
Yan Zhenzhen
B
Bo Li
DOI：10.1109/TCSII.2025.3582493delete
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Abstract

Abstract

En 中文
This brief describes a novel latch design, the Single-Event Upset (SEU) monitoring-based Radiation Hardened Latch (SMRHL), which is robust under multi-node upset (MNU) conditions. The SEU monitoring circuit of SMRHL is designed to detect the presence of SEU events inside the latch and trigger alarm signals accordingly, thus ensuring that the SMRHL can output correct data. The simulation results demonstrate that the proposed SMRHL minimizes the number of SEU-sensitive nodes and achieves a significant improvement of up to 57.9X in power-delay-area-product compared to other state-of-the-art MNU latches. Additionally, the SMRHL’s capability to generate SEU alarm signals enhances reliability at the system architecture level.
Keywords:
Radiation hardening by design (RHBD)
latch
soft error
multi-node upset (MNU)
single-event upset (SEU)

Journal

I
IEEE Transactions on Circuits and Systems and Express Briefs
IF:
4.9
Papers:
8.8K
Citations:
2.5W

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