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Single particle X-ray diffractive imaging

delete2007-12-21
delete236
delete
OA
AI
M
Michael J. Bogan *
W
W. Henry Benner
S
Sébastien Boutet
U
Urs Rohner
M
Matthias Frank
A
Anton Barty
M
M. Seibert
F
Filipe R. N. C. Maia
S
Stefano Marchesini
S
S. Bajt
B
Bruce W. Woods
V
Vincent Riot
S
Stefan P. Hau‐Riege
M
Martin Svenda
E
Erik G. Marklund
E
Eberhard Spiller
J
János Hajdu
H
Henry N. Chapman
DOI:10.1021/nl072728kdelete
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Abstract

Abstract

En 中文
In nanotechnology, strategies for the creation and manipulation of nanoparticles in the gas phase are critically important for surface modification and substrate-free characterization. Recent coherent diffractive imaging with intense femtosecond X-ray pulses has verified the capability of single-shot imaging of nanoscale objects at suboptical resolutions beyond the radiation-induced damage threshold. By intercepting electrospray-generated particles with a single 15 femtosecond soft-X-ray pulse, we demonstrate diffractive imaging of a nanoscale specimen in free flight for the first time, an important step toward imaging uncrystallized biomolecules.
Keywords:
FREE-ELECTRON LASER
MASS-SPECTROMETRY
CONTROLLED DIMENSIONS
AERODYNAMIC LENSES
AEROSOL
NANOPARTICLES
IONIZATION
VIRUS
BEAMS
SIZE

Journal

Nano Letters cover
Nano Letters
IF:
9.1
Papers:
2.7W
Citations:
16.5W

Organization

S
Stanford University
Scholars:
9.6W
Papers: 8.2W
Citations: 17.0W
U
united states department of energy (doe)
Scholars:
11.3W
Papers: 9.6W
Citations: 246
Cited Papers

Cited Papers

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