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SM-FSOD: A Second-Order Meta-Learning Algorithm for Few-Shot PCB Defect Object Detection
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DOI：10.3390/electronics14193863.png)
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Abstract
En 中文
Few-shot object detection methods perform well in natural scenes, where meta-learners can effectively extract target features from limited support data. However, PCB defect detection faces unique challenges: scarce defect samples, low-resolution targets, and severe overfitting risks. Additionally, PCBs’ dense circuitry creates low-contrast defects that blend into background noise, while traditional meta-learning struggles to generate realistic synthetic defects under actual manufacturing constraints. To overcome these limitations, we propose SM-FSOD, a second-order meta-learning model featuring a defect-aware prototype network. Unlike conventional approaches, it dynamically emphasizes critical defect features when constructing class prototypes from few-shot samples. Our extensive few-shot experiments on the DeepPCB and DsPCBSD+ datasets demonstrate the performance of the SM-FSOD model. Comparative tests on the DeepPCB dataset show that, compared with the strong Meta-RCNN baseline, our model achieves a maximum performance improvement of 14.0% under the challenging five-shot setting, while still attaining a 7.6% accuracy gain in the more relaxed 50-shot setting. Similarly, evaluation on the DsPCBSD+ dataset reveals that our proposed method maintains an average accuracy improvement of 2.3% to 9.6% compared to the competitive DeFRCN model in complex scenarios, indicating the strong adaptability of SM-FSOD across various application environments. Ablation studies further demonstrate that incorporating the improved MOMP and DGPT modules individually yields average accuracy gains of 3.6% and 4.5%, respectively, under the five-shot setting compared to the baseline, confirming that these enhancements can orthogonally improve the detection precision in few-shot PCB scenarios.
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