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SmartFL: Semantics Based Probabilistic Fault Localization

delete2025-07-01
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PRE
AI
邬一谦 cover
邬一谦 (Yiqian Wu)
Y
Yujie Liu
Y
Yi Yin
M
Muhan Zeng
Z
Zhentao Ye
张鑫 cover
张鑫 (Xin Zhang)
Y
Yingfei Xiong
L
Lu Zhang
DOI:10.1109/TSE.2025.3574487delete
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Abstract

Abstract

En 中文
Testing-based fault localization has been a research focus in software engineering in the past decades. It localizes faulty program elements based on a set of passing and failing test executions. Since whether a fault could be triggered and detected by a test is related to program semantics, it is crucial to model program semantics in fault localization approaches. Existing approaches either consider the full semantics of the program (e.g., mutation-based fault localization and angelic debugging), leading to scalability issues, or ignore the semantics of the program (e.g., spectrum-based fault localization), leading to imprecise localization results. Our key idea is: by modeling only the correctness of program values but not their full semantics, a balance could be reached between effectiveness and scalability. To realize this idea, we introduce a probabilistic model by efficient approximation of program semantics and several techniques to address scalability challenges. Our approach, (<bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S</b>e<bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">M</b>antics b<bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">A</b>sed p<bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</b>obabilis<bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">T</b>ic <bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">F</b>ault <bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">L</b>ocalization), is evaluated on a real-world dataset, Defects4J 2.0. The top-1 statement-level accuracy of our approach is 14%, which improves 130% over the best SBFL and MBFL methods. The average time cost is 205 seconds per fault, which is half of SBFL methods. After combining our approach with existing approaches using the CombineFL framework, the performance of the combined approach is significantly boosted by an average of 10% on top-1, top-3, and top-5 accuracy compared to state-of-the-art combination methods.
Keywords:
Fault localization
semantics
probabilistic modeling

Journal

IEEE Transactions on Software Engineering cover
IEEE Transactions on Software Engineering
IF:
5.6
Papers:
2.8K
Citations:
1.1W

Organization

P
peking university
Scholars:
11.7W
Papers: 8.7W
Citations: 146