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Solution-processed amorphous silicon surface passivation layers
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DOI：10.1063/1.4896687.png)
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Abstract
En 中文
Amorphous silicon thin films, fabricated by thermal conversion of neopentasilane, were used to passivate crystalline silicon surfaces. The conversion is investigated using X-ray and constant-final-state-yield photoelectron spectroscopy, and minority charge carrier lifetime spectroscopy. Liquid processed amorphous silicon exhibits high Urbach energies from 90 to 120 meV and 200 meV lower optical band gaps than material prepared by plasma enhanced chemical vapor deposition. Applying a hydrogen plasma treatment, a minority charge carrier lifetime of 1.37 ms at an injection level of 10(15)/cm(3) enabling an implied open circuit voltage of 724 mV was achieved, demonstrating excellent silicon surface passivation. (C) 2014 AIP Publishing LLC.
Keywords:
RAY PHOTOELECTRON-SPECTROSCOPY
HETEROJUNCTION SOLAR-CELLS
GROWN SILICON
FILMS
NANOWIRES
ENERGY
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