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Solving complex nanostructures with ptychographic atomic electron tomography
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DOI：10.1038/s41467-023-43634-z.png)
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Abstract
En 中文
Transmission electron microscopy (TEM) is essential for determining atomic scale structures in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined from thousands of identical particles using phase-contrast TEM. In materials science, three-dimensional atomic structures of complex nanomaterials have been determined using atomic electron tomography (AET). However, neither of these methods can determine the three-dimensional atomic structure of heterogeneous nanomaterials containing light elements. Here, we perform ptychographic electron tomography from 34.5 million diffraction patterns to reconstruct an atomic resolution tilt series of a double wall-carbon nanotube (DW-CNT) encapsulating a complex ZrTe sandwich structure. Class averaging the resulting tilt series images and subpixel localization of the atomic peaks reveals a Zr11Te50 structure containing a previously unobserved ZrTe2 phase in the core. The experimental realization of atomic resolution ptychographic electron tomography will allow for the structural determination of a wide range of beam-sensitive nanomaterials containing light elements. Transmission electron microscopy is essential for three-dimensional atomic structure determination, but solving complex heterogeneous structures containing light elements remains challenging. Here, authors solve a complex nanostructure using atomic resolution ptychographic electron tomography.
Keywords:
PHASE-CONTRAST
DIFFRACTION
RESOLUTION
MICROSCOPY
LIMIT
STEM
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