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Span-based few-shot event detection via aligning external knowledge
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AI
DOI：10.1016/j.neunet.2024.106327.png)
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Abstract
En 中文
Few -shot Event Detection (FSED) aims to identify novel event types in new domains with very limited annotated data. Previous PN-based (Prototypical Network) joint methods suffer from insufficient learning of token -wise label dependency and inaccurate prototypes. To solve these problems, we propose a span -based FSED model, called SpanFSED, which decomposes FSED into two subprocesses, including span extractor and event classifier. In span extraction, we convert sequential labels into a global boundary matrix that enables the span extractor to acquire precise boundary information irrespective of label dependency. In event classification, we align event types with an outside knowledge base like FrameNet and construct an enhanced support set, which injects more trigger information into the prototypical network of event prototypes. The superior performance of SpanFSED is demonstrated through extensive experiments on four event detection datasets, i.e., ACE2005, ERE, MAVEN and FewEvent. Access to our code and data is facilitated through the following link: https://github.com/rickltt/FewShot_ED.
Keywords:
Few-shot event detection
Prototypical network
External knowledge base
Global boundary matrix
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