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Spectral contrast imaging microscopy
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DOI：10.1364/OL.36.003323.png)
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Abstract
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We introduce a new technique, spectral contrast imaging microscopy (SCIM), for super-resolution microscopic imaging. Based on a novel contrast mechanism that encodes each local spatial frequency with a corresponding optical wavelength, SCIM provides a real-time high-resolution spectral contrast microscopic image with superior contrast. We show that two microscopic objects, separated by a distance smaller than the diffraction limit of the optical system, can be spatially resolved in the SCIM image as different colors. Results with numerical simulation and experiments using a high-resolution United States Air Force target are presented. The ability of SCIM for imaging biological cells is also demonstrated. (C) 2011 Optical Society of America
Keywords:
WIDE-FIELD
HOLOGRAPHIC MICROSCOPY
HIGH-RESOLUTION
SUPERRESOLUTION
TISSUE
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