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Static Voltage Stability Analysis Based on Multi-Dimensional Holomorphic Embedding Method

delete2022-01-01
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PRE
AI
Y
Yuge Sun
丁涛 cover
丁涛 (Tao Ding) *
O
Ouzhu Han
刘承锡 cover
刘承锡 (Chengxi Liu)
F
Fangxing Li
DOI:10.1109/TPWRS.2022.3204067delete
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Abstract

Abstract

En 中文
The importance of voltage stability problems has progressively increased in tandem with continuously increasing electric power demand. To fast calculate the V-Q sensitivity values of multiple operating conditions which characterize generations/loads scaled in different proportions and avoid calculating power flow repeatedly, we propose a multi-variable V-Q sensitivity method based on the multi-dimensional holomorphic embedding method (MDHEM) for static voltage stability analysis. First, the MDHEM is utilized to calculate the power flow analytical expressions. Second, based on recursion theory, bus voltage expressions are used to derive voltage magnitude expressions, and multi-variable V-Q sensitivity expressions are further derived offline. Third, the V-Q sensitivity values are calculated online to identify the weak buses under multiple operating conditions and judge the saddle-node bifurcation point (SNBP). Numerical results are presented to better explain the high computational efficiency and accuracy of the proposed method.
Keywords:
Voltage stability analysis
multi-dimensional holomorphic embedding method (MDHEM)
voltage magnitude expression
V-Q sensitivity analysis method

Journal

IEEE Transactions on Power Systems cover
IEEE Transactions on Power Systems
IF:
7.2
Papers:
1.1W
Citations:
5.0W

Organization

X
xi'an jiaotong university
Scholars:
9.2W
Papers: 6.6W
Citations: 75
University of Tennessee System cover
University of Tennessee System
Scholars:
2.9W
Papers: 2.6W
Citations: 115
W
wuhan university
Scholars:
8.1W
Papers: 5.8W
Citations: 70
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