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Structural optimization of model sample for high-resolution soft/hard interface analysis
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DOI：10.1093/jmicro/dfag015.png)
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Abstract
En 中文
High-resolution structural analysis of adhesive interfaces between resins (soft materials) and inorganic materials (hard materials) is indispensable for understanding the underlying adhesion mechanisms. Scanning transmission electron microscopy-based electron energy-loss spectroscopy (STEM-EELS) is a key technique for obtaining information regarding the local chemical environment at the interfaces between amorphous resins and inorganic materials, such as metals. For realizing high-resolution STEM-EELS analysis, the design of the soft/hard interface model must be optimized. Furthermore, damage to resins caused by ion-beam irradiation during the sample milling must be avoided. Herein, we report an optimized protocol for fabricating specimens of soft/hard interfaces with ultrathin cross-sections for STEM-EELS analysis. Mini abstractWe propose an optimized protocol for precise scanning transmission electron microscopy-based electron energy-loss spectroscopy analysis of the interfacial interaction between epoxy resin and inorganic materials. In the case of soft materials, reducing damage during processing and data acquisition should be considered.
Keywords:
epoxy resins
adhesion
soft/hard interfaces
STEM-EELS
focused ion beam milling
Journal
M
IF:
1.9
Papers:
78
Citations:
927